September 1, 2022

Getting good SEM/FESEM images is dependent on both the sample conditions (conductivity, bulk vs. thin film, etc) and the instrument’s imaging parameters (e.g., beam voltage, beam current, working distance, detector, etc). Over the course of training and interacting with hundreds of different FESEM users Dr. Liu has observed the most important things a new user needs to know without overwhelming them with theory and trivial operational routines. This allows new users to conceptualize and visualize the electron beam behavior relative to the observed imaging. This webinar will simplify and explain the complex nature of SEM/FESEM imaging by drawing analogies to common things in everyday life such as writing with a pencil and driving a car.

About the Speaker
Dr. Bangzhi Liu received his Ph.D. from Michigan State University and worked as a postdoctoral research scholar in the department of Materials Science and Engineering at Penn State University. He is currently employed by Penn State Materials Research Institute as an assistant research professor. He has over 20 years’ of experience in materials characterization (FESEM, TEM, Auger, etc) and thin film deposition (PVD and ALD). He has authored and co-authored over 40 peer-reviewed journals.

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